Kim, K.W.; Adhikari, G.; Adhikari, P.; Choi, S.; Ha, C.; Hahn, I.S.; Jeon, E.J.; Joo, H.W.; Kang, W.G.; Kim, H.J., et al.
ArticleIssue Date2016CitationIEEE Transactions on Nuclear Science, v.63, no.2, pp 534 - 538PublisherInstitute of Electrical and Electronics Engineers Inc.