Lee, J. Y.; Alenkov, V.; Ali, L.; Beyer, J.; Bibi, R.; Boiko, R. S.; Boonin, K.; Buzanov, O.; Chanthima, N.; Cheoun, M. K., et al.
ArticleIssue Date2016CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.63, no.2, pp 543 - 547PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC