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Burns, E.; Goldstein, A.; Hui, C.M.; Blackburn, L.; Briggs, M.S.; Connaughton, V.; Hamburg, R.; Kocevski, D.; Veres, P.; Wilson-Hodge, C.A., et al.
Hamburg, R.; Fletcher, C.; Burns, E.; Goldstein, A.; Bissaldi, E.; Briggs, M. S.; Cleveland, W. H.; Giles, M. M.; Hui, C. M.; Kocevski, D., et al.
Fletcher, C.; Wood, J.; Hamburg, R.; Veres, P.; Hui, C.M.; Bissaldi, E.; Briggs, M.S.; Burns, E.; Cleveland, W.H.; Giles, M.M., et al.
Alenkov, V.; Bae, H.W.; Beyer, J.; Boiko, R.S.; Boonin, K.; Buzanov, O.; Chanthima, N.; Cheoun, M.K.; Choi, S.H.; Danevich, F.A., et al.
Abbott, B.P.; Abbott, R.; Abbott, T.D.; Abernathy, M.R.; Acernese, F.; Ackley, K.; Adams, C.; Adams, T.; Addesso, P.; Adhikari, R.X., et al.
Abbott, B.P.; Abbott, R.; Abbott, T.D.; Abernathy, M.R.; Acernese, F.; Ackley, K.; Adams, C.; Adams, T.; Addesso, P.; Adhikari, R.X., et al.
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