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Haefner, G.; Moschner, K.; Blazhev, A.; Boutachkov, P.; Davies, P. J.; Wadsworth, R.; Ameil, F.; Baba, H.; Back, T.; Dewald, M., et al.
Haefner, G.; Moschner, K.; Blazhev, A.; Boutachkov, P.; Davies, P. J.; Wadsworth, R.; Ameil, F.; Baba, H.; Back, T.; Dewald, M., et al.
Moschner, K.; Blazhev, A.; Warr, N.; Boutachkov, P.; Davies, P.; Wadsworth, R.; Ameil, F.; Baba, H.; Back, T.; Dewald, M., et al.
Soederstroem, P. -A.; Nishimura, S.; Xu, Z. Y.; Sieja, K.; Werner, V.; Doornenbal, P.; Lorusso, G.; Browne, F.; Gey, G.; Jung, H. S., et al.
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