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T. Teranishi; S. Kubono; H. Yamaguchi; J. J. He; A. Saito; Y. Wakabayashi; H. Fujikawa; G. Amadio; S. Nishimura; M. Nishimura, et al.
M. Notani; T. Teranishi; Y. Yanagisawa; S. Michimasa; K. Ue; J.J. He; S. Kubono; H. Iwasaki; H. Baba; M. Tamaki, et al.
J. J. He; S. Kubono; T. Teranishi; M. Notani; H. Baba; S. Nishimura; J. Y. Moon; M. Nishimura; S. Michimasa; H. Iwasaki, et al.
J. J. He; S. Kubono; T. Teranishi; M. Notani; H. Baba; S. Nishimura; J. Y. Moon; M. Nishimura; S. Michimasa; H. Iwasaki, et al.
J. Y. MOON; Lee, Chun Sik; J. H. Lee; C. C. Yun; J. C. Kim; M. Youn; S. Kubono; T. Teranishi; J. J. He; M. Notani, et al.
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