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Cited 16 time in webofscience Cited 21 time in scopus
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Approximating mutual information for multi-label feature selection

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dc.contributor.authorLee, Jaesung-
dc.contributor.authorLim, H.-
dc.contributor.authorKim, Dae-Won-
dc.date.available2019-05-29T05:40:20Z-
dc.date.issued2012-07-
dc.identifier.issn0013-5194-
dc.identifier.issn1350-911X-
dc.identifier.urihttps://scholarworks.bwise.kr/cau/handle/2019.sw.cau/20190-
dc.description.abstractProposed is a new multi-label feature selection method that captures relationships between features and labels without transforming the problem into single-label classification. Using approximated joint mutual information, the proposed incremental feature selection algorithm provides markedly better classification performance than well-known conventional methods.-
dc.format.extent2-
dc.language영어-
dc.language.isoENG-
dc.publisherINST ENGINEERING TECHNOLOGY-IET-
dc.titleApproximating mutual information for multi-label feature selection-
dc.typeArticle-
dc.identifier.doi10.1049/el.2012.1600-
dc.identifier.bibliographicCitationELECTRONICS LETTERS, v.48, no.15, pp 929 - 930-
dc.description.isOpenAccessN-
dc.identifier.wosid000306711700026-
dc.identifier.scopusid2-s2.0-84866881522-
dc.citation.endPage930-
dc.citation.number15-
dc.citation.startPage929-
dc.citation.titleELECTRONICS LETTERS-
dc.citation.volume48-
dc.type.docTypeArticle-
dc.publisher.location영국-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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