Raman spectroscopy of CuIn1-xGaxSe2 for in-situ monitoring of the composition ratio
DC Field | Value | Language |
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dc.contributor.author | Choi, In-Hwan | - |
dc.date.available | 2019-05-29T13:36:05Z | - |
dc.date.issued | 2011-04 | - |
dc.identifier.issn | 0040-6090 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/21593 | - |
dc.description.abstract | Metal organic vapor deposition (MOCVD) is a well known method for preparing high quality and large area CuIn1-xGaxSe2 (CIGS) absorber layers. Some in-situ non-contact monitoring systems are needed when CIGS absorber layers are manufactured in industry. In this study, CuInSe2 (CIS) and CIGS thin films with different composition ratios, [Cu]/[In + Ga], were prepared by MOCVD using [Me2In(mu-SeMe)](2), hexafluoroacetylacetonate Cu(I) (3,3-dimethyl-1-butene), trimethyl gallium and dimethyle diselenide as the In-Se single source, Cu, Ga and Se precursors, respectively. The Raman shift spectra of the films with various composition ratios were analyzed to produce a basic algorithm that can determine the composition ratios of CIS and CIGS thin films indirectly. (c) 2011 Elsevier B.V. All rights reserved. | - |
dc.format.extent | 4 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.title | Raman spectroscopy of CuIn1-xGaxSe2 for in-situ monitoring of the composition ratio | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.tsf.2011.02.058 | - |
dc.identifier.bibliographicCitation | THIN SOLID FILMS, v.519, no.13, pp 4390 - 4393 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.wosid | 000290187100046 | - |
dc.identifier.scopusid | 2-s2.0-79954426878 | - |
dc.citation.endPage | 4393 | - |
dc.citation.number | 13 | - |
dc.citation.startPage | 4390 | - |
dc.citation.title | THIN SOLID FILMS | - |
dc.citation.volume | 519 | - |
dc.type.docType | Article | - |
dc.publisher.location | 스위스 | - |
dc.subject.keywordAuthor | Copper indium gallium diselenide | - |
dc.subject.keywordAuthor | Copper indium diselenide | - |
dc.subject.keywordAuthor | Raman spectroscopy | - |
dc.subject.keywordAuthor | Metal organic chemical vapor deposition | - |
dc.subject.keywordPlus | CHEMICAL-VAPOR-DEPOSITION | - |
dc.subject.keywordPlus | FILMS | - |
dc.subject.keywordPlus | SPECTRA | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.description.journalRegisteredClass | sci | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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