극저온 CO₂ 세정과정 시 미세오염물의 탈착 메커니즘 연구
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 석종원 | - |
dc.contributor.author | 이성훈 | - |
dc.contributor.author | 김필기 | - |
dc.contributor.author | 이주홍 | - |
dc.date.available | 2019-08-06T07:00:02Z | - |
dc.date.issued | 2008 | - |
dc.identifier.issn | 1738-2270 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/31751 | - |
dc.description.abstract | Rapid increase of integrity for recent semiconductor industry highly demands the development of removal technology of contaminated particles in the scale of a few microns or even smaller. It is known that the surface cleaning technology using CO₂ snow has its own merits of high efficiency. However, the detailed removal mechanism of particles using this technology is not yet fully understood due to the lack of sophisticated research endeavors. The detachment mechanism of particles from the substrates is known to be belonged in four types; rebounding, sliding, rolling and lifting. In this study, a modeling effort is performed to explain the detachment mechanism of a contaminant particle due to the rebounding caused by the vertical collision of the CO₂ snow. The Hertz and Johnson-Kendall-Roberts(JKR) theories are employed to describe the contact, adhesion and deformation mechanisms of the particles on a substrate. Numerical simulations are followed for several representative cases, which provide the perspective views on the dynamic characteristics of the particles as functions of the material properties and the initial inter-particle collision velocity. | - |
dc.format.extent | 5 | - |
dc.publisher | 한국반도체디스플레이기술학회 | - |
dc.title | 극저온 CO₂ 세정과정 시 미세오염물의 탈착 메커니즘 연구 | - |
dc.title.alternative | A dynamic analysis on minute particles’ detachment mechanism in a cryogenic CO₂ cleaning process | - |
dc.type | Article | - |
dc.identifier.bibliographicCitation | 반도체디스플레이기술학회지, v.7, no.4, pp 29 - 33 | - |
dc.identifier.kciid | ART001307282 | - |
dc.description.isOpenAccess | N | - |
dc.citation.endPage | 33 | - |
dc.citation.number | 4 | - |
dc.citation.startPage | 29 | - |
dc.citation.title | 반도체디스플레이기술학회지 | - |
dc.citation.volume | 7 | - |
dc.publisher.location | 대한민국 | - |
dc.subject.keywordAuthor | Cryogenic carbon dioxide cleaning | - |
dc.subject.keywordAuthor | Sub-micron contaminant particles | - |
dc.subject.keywordAuthor | Particle removal mechanism | - |
dc.subject.keywordAuthor | Rebounding detachment mechanism | - |
dc.subject.keywordAuthor | Adhesion energy | - |
dc.description.journalRegisteredClass | kciCandi | - |
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