Nanoscale piezoresponse of 70 nm poly(vinylidene fluoride-trifluoro-ethylene) films annealed at different temperatures
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Choi, Yoon-Young | - |
dc.contributor.author | Hong, Jongin | - |
dc.contributor.author | Hong, Seungbum | - |
dc.contributor.author | Song, Hanwook | - |
dc.contributor.author | Cheong, Deok-Soo | - |
dc.contributor.author | No, Kwangsoo | - |
dc.date.available | 2021-02-17T11:40:31Z | - |
dc.date.issued | 2010-04 | - |
dc.identifier.issn | 1862-6254 | - |
dc.identifier.issn | 1862-6270 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/43717 | - |
dc.description.abstract | In order to characterize the piezoelectric properties of 70 nm thick poly(vinylidene fluoride-trifluoroethylene), P(VDF-TrFE), films grown by a spin-coating technique, both nanoscale manipulation and polarization switching were studied using piezoresponse force Microscopy (PFM). We varied the annealing, temperature from 75 degrees C to 145 degrees C and achieved a high-quality 70 nm P(VDF-TrFE) film annealed at the temperature of 95 degrees C. Ferroelecrtic domains and their properties were confirmed using X-ray diffraction, grazing incidence reflection absorption Fourier, Transform Infrared (GIRA-FTIR) and PFM analysis. The ferroelectric domains in the film were homogeneously switchable below 5 V with a remnant d(33) of 14.9 pm/V. This offers out rationale for a promise in energy harvesting and switchability would be good for plastic electronics. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim | - |
dc.format.extent | 3 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | WILEY-BLACKWELL | - |
dc.title | Nanoscale piezoresponse of 70 nm poly(vinylidene fluoride-trifluoro-ethylene) films annealed at different temperatures | - |
dc.type | Article | - |
dc.identifier.doi | 10.1002/pssr.201004009 | - |
dc.identifier.bibliographicCitation | PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.4, no.3-4, pp 94 - 96 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.wosid | 000277222000021 | - |
dc.identifier.scopusid | 2-s2.0-77950912567 | - |
dc.citation.endPage | 96 | - |
dc.citation.number | 3-4 | - |
dc.citation.startPage | 94 | - |
dc.citation.title | PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS | - |
dc.citation.volume | 4 | - |
dc.type.docType | Article | - |
dc.publisher.location | 미국 | - |
dc.subject.keywordAuthor | atomic force microscopy | - |
dc.subject.keywordAuthor | dielectrics | - |
dc.subject.keywordAuthor | thin film | - |
dc.subject.keywordAuthor | polymers | - |
dc.subject.keywordPlus | FLUORIDE TRIFLUOROETHYLENE COPOLYMER | - |
dc.subject.keywordPlus | FIELD-EFFECT TRANSISTOR | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | VINYLIDENE FLUORIDE | - |
dc.subject.keywordPlus | CRYSTALLINE | - |
dc.subject.keywordPlus | POLYMER | - |
dc.subject.keywordPlus | DEPENDENCE | - |
dc.subject.keywordPlus | MEMORY | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.description.journalRegisteredClass | sci | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
84, Heukseok-ro, Dongjak-gu, Seoul, Republic of Korea (06974)02-820-6194
COPYRIGHT 2019 Chung-Ang University All Rights Reserved.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.