Le, Van Loi; Yoo, Taegeun; Kim, Ju Eon; Ba, Ngoc Le; Baek, Kwang-Hyun; Kim, Tony Tae-Hyoung
ArticleIssue Date2020CitationIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, v.28, no.8, pp 1909 - 1919PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC