Exact locating of sub-surface microelectronic structures using scanning thermal wave microscopy
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chung, J. | - |
dc.contributor.author | Kim, K. | - |
dc.contributor.author | Hwang, G. | - |
dc.contributor.author | Kwon, O. | - |
dc.contributor.author | Lee, J.S. | - |
dc.contributor.author | Park, S. | - |
dc.contributor.author | Choi, Y.K. | - |
dc.date.accessioned | 2021-12-01T01:40:10Z | - |
dc.date.available | 2021-12-01T01:40:10Z | - |
dc.date.issued | 2008 | - |
dc.identifier.issn | 0277-786X | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/52111 | - |
dc.description.abstract | With the fast advance of ultra large scale integrated (ULSI) circuit technology, the need for sub-surface imaging technique to locate and characterize sub-surface defects in ULSI circuits has been growing. In this study we advance scanning thermal wave microscopy further so that the absolute phase lag of the thermal waves generated by an electrically heated sub-surface microelectronic structure buried in an ULSI circuit can be measured. The measurement of the absolute phase lag allowed exact locating of the vertical and horizontal position of buried microelectronic structures and evaluation of their soundness nondestructively. © 2008 SPIE. | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.title | Exact locating of sub-surface microelectronic structures using scanning thermal wave microscopy | - |
dc.type | Article | - |
dc.identifier.doi | 10.1117/12.810688 | - |
dc.identifier.bibliographicCitation | Proceedings of SPIE - The International Society for Optical Engineering, v.7268 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.scopusid | 2-s2.0-62449127957 | - |
dc.citation.title | Proceedings of SPIE - The International Society for Optical Engineering | - |
dc.citation.volume | 7268 | - |
dc.type.docType | Conference Paper | - |
dc.publisher.location | 미국 | - |
dc.subject.keywordAuthor | Non-destructive evaluation (NDE) | - |
dc.subject.keywordAuthor | Phase lag | - |
dc.subject.keywordAuthor | Scanning thermal microscopy (SThM) | - |
dc.subject.keywordAuthor | Scanning thermal wave microscopy (STWM) | - |
dc.subject.keywordAuthor | Thermal wave | - |
dc.subject.keywordPlus | Absolute phase | - |
dc.subject.keywordPlus | Circuit technologies | - |
dc.subject.keywordPlus | Non-destructive evaluation (NDE) | - |
dc.subject.keywordPlus | Phase lag | - |
dc.subject.keywordPlus | Scanning thermal microscopy (SThM) | - |
dc.subject.keywordPlus | Sub surfaces | - |
dc.subject.keywordPlus | Sub-surface defects | - |
dc.subject.keywordPlus | Sub-surface imaging | - |
dc.subject.keywordPlus | Thermal wave | - |
dc.subject.keywordPlus | Ultra large scale integrated | - |
dc.subject.keywordPlus | Concrete bridges | - |
dc.subject.keywordPlus | Imaging techniques | - |
dc.subject.keywordPlus | Integrated circuits | - |
dc.subject.keywordPlus | Intelligent structures | - |
dc.subject.keywordPlus | Ontology | - |
dc.subject.keywordPlus | Surface defects | - |
dc.subject.keywordPlus | Surface structure | - |
dc.subject.keywordPlus | ULSI circuits | - |
dc.subject.keywordPlus | Scanning | - |
dc.description.journalRegisteredClass | scopus | - |
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