Multilabel naïve Bayes classification considering label dependence
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Hae-Cheon | - |
dc.contributor.author | Park, Jin-Hyeong | - |
dc.contributor.author | Kim, Dae-Won | - |
dc.contributor.author | Lee, Jaesung | - |
dc.date.accessioned | 2022-01-03T02:40:24Z | - |
dc.date.available | 2022-01-03T02:40:24Z | - |
dc.date.issued | 2020-08 | - |
dc.identifier.issn | 0167-8655 | - |
dc.identifier.issn | 1872-7344 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/52831 | - |
dc.description.abstract | Multilabel classification is the task of assigning relevant labels to an instance, and it has received considerable attention in recent years. This task can be performed by extending a single-label classifier, such as the naïve Bayes classifier, to utilize the useful relations among labels for achieving better multilabel classification accuracy. However, the conventional multilabel naïve Bayes classifier treats each label independently and hence neglects the relations among labels, resulting in degenerated accuracy. We propose a new multilabel naïve Bayes classifier that considers the relations or dependence among labels. Experimental results show that the proposed method outperforms conventional multilabel classifiers. © 2020 Elsevier B.V. | - |
dc.format.extent | 7 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | Elsevier B.V. | - |
dc.title | Multilabel naïve Bayes classification considering label dependence | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.patrec.2020.06.021 | - |
dc.identifier.bibliographicCitation | Pattern Recognition Letters, v.136, pp 279 - 285 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.wosid | 000553824800013 | - |
dc.identifier.scopusid | 2-s2.0-85086901892 | - |
dc.citation.endPage | 285 | - |
dc.citation.startPage | 279 | - |
dc.citation.title | Pattern Recognition Letters | - |
dc.citation.volume | 136 | - |
dc.type.docType | Article | - |
dc.publisher.location | 네델란드 | - |
dc.subject.keywordAuthor | Label dependence | - |
dc.subject.keywordAuthor | Multilabel classifier | - |
dc.subject.keywordAuthor | Naïve Bayes classification | - |
dc.subject.keywordPlus | Pattern recognition | - |
dc.subject.keywordPlus | Software engineering | - |
dc.subject.keywordPlus | Bayes classification | - |
dc.subject.keywordPlus | Bayes Classifier | - |
dc.subject.keywordPlus | Multi-label | - |
dc.subject.keywordPlus | Multi-label classifications | - |
dc.subject.keywordPlus | Classification (of information) | - |
dc.relation.journalResearchArea | Computer Science | - |
dc.relation.journalWebOfScienceCategory | Computer Science, Artificial Intelligence | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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