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TOF-SIMS and XPS analysis of ancient and forensic materials
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Yeonhee | - |
| dc.contributor.author | Lee, Jihye | - |
| dc.contributor.author | Ham, Seung Wook | - |
| dc.contributor.author | Lee, Kangbong | - |
| dc.contributor.author | Kim, Kang-Jin | - |
| dc.date.accessioned | 2022-01-24T03:45:02Z | - |
| dc.date.available | 2022-01-24T03:45:02Z | - |
| dc.date.issued | 2009-03 | - |
| dc.identifier.issn | 0065-7727 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/54208 | - |
| dc.format.extent | 1 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | AMER CHEMICAL SOC | - |
| dc.title | TOF-SIMS and XPS analysis of ancient and forensic materials | - |
| dc.type | Article | - |
| dc.identifier.bibliographicCitation | ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, v.237, pp 207 - 207 | - |
| dc.description.isOpenAccess | N | - |
| dc.identifier.wosid | 000207857800182 | - |
| dc.citation.endPage | 207 | - |
| dc.citation.startPage | 207 | - |
| dc.citation.title | ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | - |
| dc.citation.volume | 237 | - |
| dc.type.docType | Meeting Abstract | - |
| dc.publisher.location | 미국 | - |
| dc.relation.journalResearchArea | Chemistry | - |
| dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
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