Assembly part recognition using part-based superquadric model
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, S.-H. | - |
dc.contributor.author | Hong, H.-K. | - |
dc.contributor.author | Choi, J.-S. | - |
dc.date.accessioned | 2022-04-14T10:40:07Z | - |
dc.date.available | 2022-04-14T10:40:07Z | - |
dc.date.issued | 1999-09 | - |
dc.identifier.issn | 2159-3442 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/56578 | - |
dc.description.abstract | This paper presents a new volumetric approach to 3D object recognition by using PBSM (Part-Based Superquadric Model). The assembly part object usually can be constructed with the set of volumetric primitives and their relationships. We describe volumetric properties of the model object with superquadric parameters. In addition, our model base has the relationships of volumetric primitives as well as the surface information: the surface type, the junction type between neighboring surfaces. By using surface attributes and volumetrics, our integrated recognition approach is robust to the variation of the identity, position, and orientation of assembly parts. Furthermore, we can reduce the effects of self-occlusion and non-linear shape changes according to the viewpoint. © 1999 IEEE. | - |
dc.format.extent | 4 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.title | Assembly part recognition using part-based superquadric model | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/TENCON.1999.818455 | - |
dc.identifier.bibliographicCitation | IEEE Region 10 Annual International Conference, Proceedings/TENCON, v.1, pp 479 - 482 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.scopusid | 2-s2.0-36348981339 | - |
dc.citation.endPage | 482 | - |
dc.citation.startPage | 479 | - |
dc.citation.title | IEEE Region 10 Annual International Conference, Proceedings/TENCON | - |
dc.citation.volume | 1 | - |
dc.type.docType | Conference Paper | - |
dc.publisher.location | 미국 | - |
dc.subject.keywordPlus | Volumetric analysis | - |
dc.subject.keywordPlus | 3d object recognition | - |
dc.subject.keywordPlus | Self occlusion | - |
dc.subject.keywordPlus | Shape change | - |
dc.subject.keywordPlus | Surface attributes | - |
dc.subject.keywordPlus | Surface information | - |
dc.subject.keywordPlus | Volumetric approach | - |
dc.subject.keywordPlus | Volumetric properties | - |
dc.subject.keywordPlus | Volumetrics | - |
dc.subject.keywordPlus | Object recognition | - |
dc.description.journalRegisteredClass | scopus | - |
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