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Scanning low-temperature element-specific magnetic microscopy

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dc.contributor.authorCady, A.-
dc.contributor.authorHaskel, Daniel-
dc.contributor.authorLang, Jonathan C.-
dc.contributor.authorSrajer, George-
dc.contributor.authorChupas, Peter J.-
dc.contributor.authorOsborn, Raymond-
dc.contributor.authorMitchell, J.F.-
dc.contributor.authorAhn, Jai-seok-
dc.contributor.authorHur, N.-
dc.contributor.authorPark, Soonyong-
dc.contributor.authorCheong, Sang-Wook-
dc.date.accessioned2022-05-06T06:40:16Z-
dc.date.available2022-05-06T06:40:16Z-
dc.date.issued2005-06-
dc.identifier.issn0034-6748-
dc.identifier.issn1089-7623-
dc.identifier.urihttps://scholarworks.bwise.kr/cau/handle/2019.sw.cau/57357-
dc.description.abstractWe have developed a low-temperature element-specific magnetic microscopy instrument at beamline 4-ID-D of the Advanced Photon Source. The setup enables simultaneous chemical and magnetic characterization of materials with similar to 1 mu m(2) resolution at low temperature (> 10 K) under a moderate applied field (< 0.8 T). We demonstrate the potential of this apparatus by presenting results correlating chemical and magnetic local behavior in inhomogeneous layered manganites and multiferroic systems. (c) 2005 American Institute of Physics.-
dc.language영어-
dc.language.isoENG-
dc.publisherAMER INST PHYSICS-
dc.titleScanning low-temperature element-specific magnetic microscopy-
dc.typeArticle-
dc.identifier.doi10.1063/1.1921510-
dc.identifier.bibliographicCitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.76, no.6-
dc.description.isOpenAccessN-
dc.identifier.wosid000229962000057-
dc.identifier.scopusid2-s2.0-20644441325-
dc.citation.number6-
dc.citation.titleREVIEW OF SCIENTIFIC INSTRUMENTS-
dc.citation.volume76-
dc.type.docTypeArticle-
dc.publisher.location미국-
dc.subject.keywordPlusLAYERED MANGANITES-
dc.subject.keywordPlusX-RAYS-
dc.subject.keywordPlusPHASE-
dc.subject.keywordPlusLA1.2SR1.8MN2O7-
dc.relation.journalResearchAreaInstruments & Instrumentation-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryInstruments & Instrumentation-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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