전력용 MOSFET의 온-상태 저항 측정 및 노화 시험 환경 구축
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 신준호 | - |
dc.contributor.author | 신종원 | - |
dc.date.accessioned | 2022-12-15T07:43:37Z | - |
dc.date.available | 2022-12-15T07:43:37Z | - |
dc.date.issued | 2022 | - |
dc.identifier.issn | 1229-2214 | - |
dc.identifier.issn | 2288-6281 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/59655 | - |
dc.description.abstract | This paper presents setting up a laboratory-scale testbed to estimate the aging of power MOSFET devices and integrated power modules by measuring its on-state voltage and current. Based on the aging mechanisms of the component inside the power module (e.g., bond-wire, solder layer, and semiconductor chip), a system to measure the on-state resistance of device-under-test (DUT) is designed and experimented: a full-bridge circuit applies current stress to DUT, and a temperature chamber controls the ambient temperature of DUT during the aging test. The on-state resistance of SiC MOSFET measured by the proposed testbed was increased by 2.5%–3% after 44-hour of the aging test. | - |
dc.format.extent | 8 | - |
dc.language | 한국어 | - |
dc.language.iso | KOR | - |
dc.publisher | 전력전자학회 | - |
dc.title | 전력용 MOSFET의 온-상태 저항 측정 및 노화 시험 환경 구축 | - |
dc.title.alternative | Testbed of Power MOSFET Aging Including the Measurement of On-State Resistance | - |
dc.type | Article | - |
dc.identifier.bibliographicCitation | 전력전자학회 논문지, v.27, no.3, pp 206 - 213 | - |
dc.identifier.kciid | ART002847342 | - |
dc.description.isOpenAccess | N | - |
dc.citation.endPage | 213 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 206 | - |
dc.citation.title | 전력전자학회 논문지 | - |
dc.citation.volume | 27 | - |
dc.publisher.location | 대한민국 | - |
dc.subject.keywordAuthor | Power MOSFET | - |
dc.subject.keywordAuthor | Integrated power module | - |
dc.subject.keywordAuthor | Accelerated aging test | - |
dc.subject.keywordAuthor | On-state resistance | - |
dc.description.journalRegisteredClass | kci | - |
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