High-speed thermoreflectance microscopy using charge-coupled device-based Fourier-domain filtering
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Choi, Woo June | - |
dc.contributor.author | Ryu, Seon Young | - |
dc.contributor.author | Kim, Jun Ki | - |
dc.contributor.author | Kim, Dong Uk | - |
dc.contributor.author | Kim, Geon Hee | - |
dc.contributor.author | Chang, Ki Soo | - |
dc.date.accessioned | 2023-10-04T06:41:19Z | - |
dc.date.available | 2023-10-04T06:41:19Z | - |
dc.date.issued | 2013-09 | - |
dc.identifier.issn | 0146-9592 | - |
dc.identifier.issn | 1539-4794 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/67990 | - |
dc.description.abstract | We present a Fourier-domain filtering method for charge-coupled device (CCD)-based thermoreflectance microscopy to improve the thermal imaging speed while maintaining high thermal sensitivity. The time-varying reflected light distribution from the surface of bias-modulated microresistor was recorded by a CCD camera in free-run mode and converted to the frequency domain using the fast Fourier transform (FFT) for all pixels of the CCD. After frequency peak filtering followed by inverse FFT, a thermoreflectance image was obtained. The imaging results of the proposed method were quantitatively compared with those of the conventional four-bucket method, showing that the Fourier-domain filtering method can provide thermal imaging 24-42 times faster than the four-bucket method, depending on the required thermal sensitivity. (C) 2013 Optical Society of America | - |
dc.format.extent | 4 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | OPTICAL SOC AMER | - |
dc.title | High-speed thermoreflectance microscopy using charge-coupled device-based Fourier-domain filtering | - |
dc.type | Article | - |
dc.identifier.doi | 10.1364/OL.38.003581 | - |
dc.identifier.bibliographicCitation | OPTICS LETTERS, v.38, no.18, pp 3581 - 3584 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.wosid | 000325212800029 | - |
dc.identifier.scopusid | 2-s2.0-84884266707 | - |
dc.citation.endPage | 3584 | - |
dc.citation.number | 18 | - |
dc.citation.startPage | 3581 | - |
dc.citation.title | OPTICS LETTERS | - |
dc.citation.volume | 38 | - |
dc.type.docType | Article | - |
dc.publisher.location | 미국 | - |
dc.relation.journalResearchArea | Optics | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.description.journalRegisteredClass | sci | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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