Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

End-to-end metric learning from corrupted images using triplet dimensionality reduction loss

Full metadata record
DC FieldValueLanguage
dc.contributor.authorPark, Juhyeon-
dc.contributor.authorHong, Jin-
dc.contributor.authorKwon, Junseok-
dc.date.accessioned2023-11-21T07:40:17Z-
dc.date.available2023-11-21T07:40:17Z-
dc.date.issued2024-03-
dc.identifier.issn0957-4174-
dc.identifier.issn1873-6793-
dc.identifier.urihttps://scholarworks.bwise.kr/cau/handle/2019.sw.cau/68600-
dc.description.abstractIn this paper, we present a novel dimensionality reduction term (i.e. TripletPCA and ContrastivePCA) designed to enhance the robustness of pair-based loss functions in metric learning against image corruptions. Notably, our approach achieves this without the need for any data preprocessing steps. Our method can be seamlessly integrated into existing models, such as a block with Plug & Play framework. To the best of our knowledge, our TripletPCA and ContrastivePCA represent the first attempts to incorporate dimensionality reduction directly into pair-based metric learning losses for end-to-end metric learning. By projecting image features into low-dimensional vectors, our proposed loss functions effectively retain the essential components of images while mitigating the impact of corrupted features. Consequently, our metric learning loss function accurately computes feature distances through the projection. Experimental results demonstrate that our dimensionality reduction term can be easily incorporated into various types of existing deep neural networks. This integration leads to a substantial improvement in performance on standard benchmark datasets for corrupted image classification tasks. On several corruption datasets, we achieve an average performance improvement of 10.55% compared to existing baseline methods. Our code is available at https://github.com/Juryun/TDRL. © 2023 Elsevier Ltd-
dc.language영어-
dc.language.isoENG-
dc.publisherElsevier Ltd-
dc.titleEnd-to-end metric learning from corrupted images using triplet dimensionality reduction loss-
dc.typeArticle-
dc.identifier.doi10.1016/j.eswa.2023.122064-
dc.identifier.bibliographicCitationExpert Systems with Applications, v.238-
dc.description.isOpenAccessN-
dc.identifier.wosid001101743800001-
dc.identifier.scopusid2-s2.0-85174483193-
dc.citation.titleExpert Systems with Applications-
dc.citation.volume238-
dc.type.docTypeArticle; Early Access-
dc.publisher.location영국-
dc.subject.keywordAuthorCorrupted images-
dc.subject.keywordAuthorEnd-to-end metric learning-
dc.subject.keywordAuthorPrincipal component analysis-
dc.subject.keywordAuthorTriplet dimensionality reduction loss-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaOperations Research & Management Science-
dc.relation.journalWebOfScienceCategoryComputer Science, Artificial Intelligence-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryOperations Research & Management Science-
dc.description.journalRegisteredClassscopus-
Files in This Item
Appears in
Collections
College of Software > School of Computer Science and Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kwon, Junseok photo

Kwon, Junseok
소프트웨어대학 (소프트웨어학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE