Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Variational cycle-consistent imputation adversarial networks for general missing patterns

Full metadata record
DC Field Value Language
dc.contributor.authorLee, Woojin-
dc.contributor.authorLee, Sungyoon-
dc.contributor.authorByun, Junyoung-
dc.contributor.authorKim, Hoki-
dc.contributor.authorLee, Jaewook-
dc.date.accessioned2024-02-14T01:30:29Z-
dc.date.available2024-02-14T01:30:29Z-
dc.date.issued2022-09-
dc.identifier.issn0031-3203-
dc.identifier.issn1873-5142-
dc.identifier.urihttps://scholarworks.bwise.kr/cau/handle/2019.sw.cau/72008-
dc.description.abstractImputation of missing data is an important but challenging issue because we do not know the underlying distribution of the missing data. Previous imputation models have addressed this problem by assuming specific kinds of missing distributions. However, in practice, the mechanism of the missing data is un-known, so the most general case of missing pattern needs to be considered for successful imputation. In this paper, we present cycle-consistent imputation adversarial networks to discover the underlying distribution of missing patterns closely under some relaxations. Using adversarial training, our model successfully learns the most general case of missing patterns. Therefore our method can be applied to a wide variety of imputation problems. We empirically evaluated the proposed method with numerical and image data. The result shows that our method yields the state-of-the-art performance quantitatively and qualitatively on standard datasets. (c) 2022 Elsevier Ltd. All rights reserved.-
dc.language영어-
dc.language.isoENG-
dc.publisherELSEVIER SCI LTD-
dc.titleVariational cycle-consistent imputation adversarial networks for general missing patterns-
dc.typeArticle-
dc.identifier.doi10.1016/j.patcog.2022.108720-
dc.identifier.bibliographicCitationPATTERN RECOGNITION, v.129-
dc.description.isOpenAccessN-
dc.identifier.wosid000799156200003-
dc.identifier.scopusid2-s2.0-85129233877-
dc.citation.titlePATTERN RECOGNITION-
dc.citation.volume129-
dc.type.docTypeArticle-
dc.publisher.location영국-
dc.subject.keywordAuthorImputation-
dc.subject.keywordAuthorMissing data-
dc.subject.keywordAuthorCycle-consistent-
dc.subject.keywordAuthorImputation-
dc.subject.keywordAuthorMissing data-
dc.subject.keywordAuthorCycle-consistent-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryComputer Science, Artificial Intelligence-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
Files in This Item
There are no files associated with this item.
Appears in
Collections
ETC > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Byun, Junyoung photo

Byun, Junyoung
대학원 (통계데이터사이언스학과)
Read more

Altmetrics

Total Views & Downloads

BROWSE