Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Series DC Arc Fault Detection Using Machine Learning Algorithmsopen access

Authors
Dang, H.Kim, J.Kwak, SangShinChoi, S.
Issue Date
Sep-2021
Publisher
Institute of Electrical and Electronics Engineers Inc.
Keywords
Arc Fault Detection; Artificial Intelligence; DC Arc Fault; Machine Learning; Series Arc
Citation
IEEE Access, v.9, pp 133346 - 133364
Pages
19
Journal Title
IEEE Access
Volume
9
Start Page
133346
End Page
133364
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/72863
DOI
10.1109/ACCESS.2021.3115512
ISSN
2169-3536
2169-3536
Abstract
The wide variety of arc faults induced by different load types renders residential series arc fault detection complicated and challenging. Series dc arc faults could cause fire accidents and adversely affect power systems if not promptly detected. However, in practical power systems, they are difficult to detect because of a low arc current, absence of a zero-crossing period, and various abnormal behavior based on different types of power loads and controllers. In particular, conventional protection fuses may not be activated when they occur. Undetected arc faults could cause false operation of power systems and potentially lead to damage to property and human casualties. Therefore, it is imperative to develop a detection system for series arc faults in DC systems for the reliable and efficient operation of such systems. In this study, several typical loads, especially nonlinear and complex loads such as power electronic loads, were chosen and analyzed, and five time-domain parameters of the current—average value, median value, variance value, RMS value, and distance of the maximum and minimum values—were chosen for arc fault detection. Various machine learning algorithms were used for arc fault detection and their detection accuracies were compared. Author
Files in This Item
Appears in
Collections
College of ICT Engineering > School of Electrical and Electronics Engineering > 3. Books & Book Chapters

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kwak, Sang Shin photo

Kwak, Sang Shin
창의ICT공과대학 (전자전기공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE