Hyperspectral imaging of complex dielectric functions in 2D materials
DC Field | Value | Language |
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dc.contributor.author | Kim, Un Jeong | - |
dc.contributor.author | Han, Yoojoong | - |
dc.contributor.author | Nugera, Florence A. | - |
dc.contributor.author | Yun, Seok Joon | - |
dc.contributor.author | Kim, Seok In | - |
dc.contributor.author | Lee, Moonsang | - |
dc.contributor.author | Gutiérrez, Humberto R. | - |
dc.contributor.author | Lee, Young Hee | - |
dc.contributor.author | Son, Hyungbin | - |
dc.date.accessioned | 2024-03-18T05:01:05Z | - |
dc.date.available | 2024-03-18T05:01:05Z | - |
dc.date.issued | 2024-04 | - |
dc.identifier.issn | 1748-0132 | - |
dc.identifier.issn | 1878-044X | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/72887 | - |
dc.description.abstract | It remains a challenge to characterize inhomogeneities in two-dimensional (2D) layered materials associated with strain and defects. Spectroscopic ellipsometry and reflectance/transmittance measurement can be used to characterize complex dielectric functions. However, these techniques are not well suited for submicron spectroscopic imaging of inhomogeneities across a macroscale sample. Here, we report hyperspectral phase microscopy (HPM) to image spatially-resolved complex dielectric functions of refractive index and extinction coefficient of transition metal dichalcogenides. This was implemented by measuring wavelength-dependent phase shifts in optical interference, which were then analyzed by a simple Kramers-Kronig-consistent model. We successfully image not only the phase difference but also patterns of modulated carrier density and strain in mono-/bi-layer heterostructured transition metal dichalcogenides. © 2024 Elsevier Ltd | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | Elsevier B.V. | - |
dc.title | Hyperspectral imaging of complex dielectric functions in 2D materials | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.nantod.2024.102170 | - |
dc.identifier.bibliographicCitation | Nano Today, v.55 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.wosid | 001184442200001 | - |
dc.identifier.scopusid | 2-s2.0-85184814950 | - |
dc.citation.title | Nano Today | - |
dc.citation.volume | 55 | - |
dc.type.docType | Article | - |
dc.publisher.location | 영국 | - |
dc.subject.keywordAuthor | Extinction coefficient | - |
dc.subject.keywordAuthor | Hyperspectral phase microscopy | - |
dc.subject.keywordAuthor | Refractive index | - |
dc.subject.keywordAuthor | Spatially-resolved complex dielectric function | - |
dc.subject.keywordAuthor | Transition metal dichalcogenides | - |
dc.subject.keywordPlus | GRAIN-BOUNDARIES | - |
dc.subject.keywordPlus | GRAPHENE | - |
dc.subject.keywordPlus | GROWTH | - |
dc.subject.keywordPlus | MOS2 | - |
dc.subject.keywordPlus | HETEROSTRUCTURES | - |
dc.subject.keywordPlus | STRAIN | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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