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KCI

IEEE 1149.7 표준 테스트 인터페이스를 사용한 핀 수 절감 테스트 기술 Go to Link

임명훈; 김두영; 문창민; 박성주

ArticleIssue Date2013Citation전자공학회논문지, v.50, no.9, pp 60 - 67Publisher대한전자공학회

OTHER

증강현실을 이용한 직소퍼즐 구현 Go to Link

이종민; 안도환; 임명훈; 김재형; 문영식

ArticleIssue Date2011Citation한국통신학회 2011년도 동계종합학술발표회 논문집, v.44, no.1, pp 785 - 786Publisher한국통신학회

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