Chang, Yun-Tzu; van Dorpe, Pol; Cavaco, Celso; Vinci, Andrea; Sinha, Mitali; Boulenc, Pierre; Suss, Andreas; Verschooten, Tom; van Hoof, Chris; Lee, Jiwon
ArticleIssue Date2022CitationIEEE Sensors Journal, v.22, no.19, pp 18428 - 18436PublisherInstitute of Electrical and Electronics Engineers