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Accurate Atomic-Scale Imaging of Two-Dimensional Lattices Using Atomic Force Microscopy in Ambient ConditionsGo to Linkopen access

Kim, Sunghyun; Moon, Donghyeon; Jeon, Bo Ram; Yeon, Jegyeong; Li, Xiaoqin; Kim, Suenne

ArticleIssue Date2022CitationNanomaterials, v.12, no.9, pp 1 - 17PublisherMDPI
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