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Self-supervised machine learning framework for high-throughput electron microscopyGo to Linkopen access

Kim, Joodeok; Rhee, Jinho; Kang, Sungsu; Jung, Mingyu; Kim, Jihoon; Jeon, Miji; Park, Junsun; Ham, Jimin; Kim, Byung Hyo; Lee, Won Chul, et al.

ArticleIssue Date2025CitationScience Advances , v.11, no.14, pp 1 - 12PublisherAmerican Association for the Advancement of Science
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