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Effect of Source/Drain Electrode Materials on the Electrical Performance and Stability of Amorphous Indium-Tin-Zinc-Oxide FETsGo to Link

An, Seong Ui; Ahn, Dae-Hwan; Ju, Gijun; Chen, Simin; Ji, Yo Seop; Han, Jae-Hoon; Kim, Jaekyun; Kim, Younghyun

ArticleIssue Date2024CitationIEEE Transactions on Electron Devices, v.71, no.9, pp 5437 - 5442PublisherInstitute of Electrical and Electronics Engineers
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