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Browsing by Khan, Saqib AliAuthor

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An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation Go to Link

Khan, Saqib Ali; Lim, Chulseung; Bak, Geunyong; Baeg, Sanghyeon; Lee, Soonyoung

ArticleIssue Date2017CitationMICROELECTRONICS RELIABILITY, v.69, pp 100 - 108PublisherPERGAMON-ELSEVIER SCIENCE LTD

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Architectural design tradeoffs in SRAM-based TCAMs Go to Link

Ahmed, Ali; Park, Kyungbae; Khan, Saqib Ali; Maroof, Naeem; Baeg, Sanghyeon

ArticleIssue Date2019CitationIEICE ELECTRONICS EXPRESS, v.16, no.13, pp 1 - 3PublisherIEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG

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Browsing by Khan, Saqib AliAuthor

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