Yoon, Younghyun; Duan, Quanzhen; Yeo, Jaejin; Roh, Jeongjin; Kim, Jongjin; Kim, Dongwook
ArticleIssue Date2016CitationIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.65, no.7, pp.1530 - 1539PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC