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SCIESCOPUS
Degradation of nitride/W/WNx/poly-Si gate stack by post-thermal processesGo to Link

Cho, Heung Jae; Jang, Se-Aug; Kim, Yong Soo; Lim, Kwan-Yong; Oh, Jae-Geun.; Lee, Jung-Ho; Park, Tae-Su; Back, Tae-Sun; Yang, Jun-Mo; Yang, Hong-Seon, et al.

ArticleIssue Date2005CitationJapanese Journal of Applied Physics, v.44, no.4 B, pp 2221 - 2224PublisherIOP Publishing Ltd
SCIESCOPUS
Editorial Message: Special Issue on Fuzzy System in Data Mining and Knowledge Discovery: Modelling and ApplicationGo to Link

Bae, Youngchul; Kim, Yong Soo; Rhee, Frank Chung Hoon; Kim, Yong-Tae; Tao, Chin-Wang

ArticleIssue Date2017CitationINTERNATIONAL JOURNAL OF FUZZY SYSTEMS, v.19, no.4, pp 1157 - 1157PublisherSPRINGER
SCOPUS
Effect of gate hard mask and sidewall spacer structures on the gate oxide reliability of W/WNx/poly-Si gate MOSFET for high density DRAM applicationsGo to Link

Lim, Kwan Yong; Cho, Heung Jae; Jang, Se Aug; Kim, Yong Soo; Oh, Jae Geun; Lee, Jung Ho; Yang, Hong Seon; Sohn, Hyun Chul.; Kim, Jin Woong

ArticleIssue Date2005CitationJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, v.23, no.3, pp 1036 - 1040PublisherAmerican Institute of Physics
SCIESCOPUS
Interference-Enhanced Broadband Absorption of Monolayer MoS2 on Sub-100 nm Thick SiO2/Si Substrates: Reflection and Transmission Phase Changes at InterfacesGo to Link

Kim, Eunah; Cho, Jin-Woo; Kim, Bo Ra; Trang Thi Thu Nguyen; Nam, Yoon-Ho; Kim, Sun-Kyung; Yoon, Seokhyun; Kim, Yong Soo; Lee, Jung-Ho; Kim, Dong-Wook

ArticleIssue Date2018CitationAdvanced Materials Interfaces, v.5, no.12, pp 1 - 7PublisherJohn Wiley and Sons Ltd
SCIESCOPUS
Universal Oriented van der Waals Epitaxy of 1D Cyanide Chains on Hexagonal 2D CrystalsGo to Link

Lee, Yangjin; Koo, Jahyun; Lee, Sol; Yoon, Jun-Yeong; Kim, Kangwon; Jang, Myeongjin; Jang, Jeongsu; Choe, Jeongheon; Li, Bao-Wen; Le, Chinh Tam, et al.

ArticleIssue Date2020CitationAdvanced Science, v.7, no.4, pp 1 - 9PublisherWiley-VCH Verlag
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