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Morphology and ellipsometry study of pentacene films grown on native SiO2 and glass substratesGo to Link

Kim, Chaeho; Bang, Kyoungyoon; An, Ilsin; Kang, Chijung; Kim, Yongsang; Jeon, Dongryul

ArticleIssue Date2006CitationCurrent Applied Physics, v.6, no.5, pp 925 - 930PublisherThe Korean Physical Society
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