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Correctable and uncorrectable errors using large scale DRAM DIMMs in replacement network serversGo to Link

Baeg, Sanghyeon; Qasim, Mirza; Kwon, Junhyeong; Li, Tan; Gupta, Nilay; Wen, Shi-Jie; Kolli, Satyadev

ArticleIssue Date2019CitationMICROELECTRONICS RELIABILITY, v.99, pp 104 - 112PublisherPERGAMON-ELSEVIER SCIENCE LTD
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