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Browsing by Kwon, JunhyeongAuthor

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Correctable and uncorrectable errors using large scale DRAM DIMMs in replacement network servers Go to Link

Baeg, Sanghyeon; Qasim, Mirza; Kwon, Junhyeong; Li, Tan; Gupta, Nilay; Wen, Shi-Jie; Kolli, Satyadev

ArticleIssue Date2019CitationMICROELECTRONICS RELIABILITY, v.99, pp 104 - 112PublisherPERGAMON-ELSEVIER SCIENCE LTD

SCIESCOPUS

DDR4 Ball Grid Array Package Intermittent Fracture Effect on Signal Integrity Go to Link

Waqar, Muhammad; Chang, Young-Bin; Kwon, Junhyeong; Kim, Jeong-Hwan; Baeg, Sanghyeon

ArticleIssue Date2023CitationIEEE Transactions on Components, Packaging and Manufacturing Technology, v.13, no.1, pp 70 - 78PublisherInstitute of Electrical and Electronics Engineers Inc.

SCIESCOPUS

FBGA solder ball defect effect on DDR4 data signal rise time and ISI measured by loading the data line with a capacitor Go to Link

Waqar, Muhammad; Baeg, Sanghyeon; Bak, Geunyong; Kwon, Junhyeong; Lee, Kiseok; Jeon, Sang woon

ArticleIssue Date2020CitationMicroelectronics Reliability, v.114, pp 1 - 6PublisherElsevier Ltd

SCIESCOPUS

Temperature Estimation of HBM2 Channels with Tail Distribution of Retention Errors in FPGA-HBM2 Platform Go to Link open access

Kwon, Junhyeong; Wen, Shi-Jie; Fung, Rita; Baeg, Sanghyeon

ArticleIssue Date2023CitationELECTRONICS, v.12, no.1, pp 1 - 17PublisherMDPI

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Browsing by Kwon, JunhyeongAuthor

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