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Showing results 1 to 2 of 2
OTHER
An Empirical Comparison of Model-Agnostic Techniques for Defect Prediction Models
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Lee,Gichan;
Scott Uk-Jin Lee
Article
Issue Date
2023
Citation
2023 IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER), pp 179 - 189
Publisher
IEEE
OTHER
NeuroJIT: Improving Just-In-Time Defect Prediction Using Neurophysiological and Empirical Perceptions of Modern Developers
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open access
Lee,Gichan; Ju,Hansae;
Lee,Scott Uk-Jin
Article
Issue Date
2024
Citation
ASE '24: Proceedings of the 39th IEEE/ACM International Conference on Automated Software Engineering, pp 594 - 605
Publisher
Association for Computing Machinery
1
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