Lee, Yeonjoon; Li, T.; Zhang, N.; Demetriou, S.; Zha, M.; Wang, X.; Chen, K.; Zhou, X.; Han, X.; Grace, M.
ArticleIssue Date2017CitationProceedings - 47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2017, pp.403 - 414PublisherInstitute of Electrical and Electronics Engineers Inc.