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Designing ad-hoc scrubbing sequences to improve memory reliability against soft errorsGo to Link

Reviriego, Pedro; Maestro, Juan Antonio; Baeg, Sanghyeon

ArticleIssue Date2011CitationProceedings - Design Automation Conference, pp 700 - 705PublisherInstitute of Electrical and Electronics Engineers Inc.
SCOPUS
Selection of the optimal interleaving distance for memories suffering MCUsGo to Link

Reviriego, Pedro; Maestro, Juan Antonio; Baeg, Sanghyeon; Wen, Shijie; Wong, Richard

ArticleIssue Date2009Citation10th European Conference on Radiation Effects on Components and Systems, pp 1 - 4PublisherIEEE
SCIESCOPUS
Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplicationGo to Link

Maestro, Juan Antonio; Reviriego, Pedro; Baeg, Sanghyeon; Wen, ShiJie; Wong, Richard

ArticleIssue Date2013CitationMICROPROCESSORS AND MICROSYSTEMS, v.37, no.8, pp 1103 - 1107PublisherELSEVIER
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