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Reversible capacitance changes in the MOS capacitor with an ITO/CeO2/p-Si structureGo to Link

Park, Daehoon; Kim, Minju; Beom, Keonwon; Cho, Seong-Yong; Kang, Chi Jung; Yoon, Tae-Sik

ArticleIssue Date2019CitationJournal of Alloys and Compounds, v.786, pp 655 - 661PublisherElsevier BV
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