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Ball Grid Array Package Intermittent Partial Connection Defect Analysis in DDR4 Data Channel

Waqar, Muhammad; Chang, Young-Bin; Park, HyeonU; Baeg, Sanghyeon

ArticleIssue Date2025CitationIEEE Transactions on Components, Packaging and Manufacturing Technology, v.15, no.2, pp 367 - 376PublisherInstitute of Electrical and Electronics Engineers Inc.
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