Pethe, Abhijit; Krishnamohan, Tejas; Kim, Donghyun; Oh, Saeroonter; Wong, H.S. Philip; Nishi, Yoshio; Saraswat, Krishna C.
ArticleIssue Date2005CitationTechnical Digest - International Electron Devices Meeting, IEDM, v.2005, pp.605 - 608PublisherIEEE