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Analysis of electrical properties and deep level defects in undoped GaN Schottky barrier diodeGo to Link

Peta, Koteswara Rao; Park, Byung-Guon; Lee, Sang-Tae; Kim, Moon-Deock; Oh, Jae-Eung; Kim, Tae-Geun; Reddy, V. Rajagopal

ArticleIssue Date2013CitationTHIN SOLID FILMS, v.534, pp 603 - 608PublisherELSEVIER SCIENCE SA
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