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Modeling and analysis of single-event transient sensitivity of a 65 nm clock treeGo to Link

Li, Yuanqing; Chen, Li; Nofal, Issam; Chen, Mo; Wang, Haibin; Liu, Rui; Chen, Qingyu; Krstic, Milos; Shi, Shuting; Guo, Gang, et al.

ArticleIssue Date2018CitationMICROELECTRONICS RELIABILITY, v.87, pp 24 - 32PublisherPERGAMON-ELSEVIER SCIENCE LTD
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