Wang, Yukai; Fu, Bowen; Saqib, Najam Us; Hahm, Gyeong-June; Cheon, Kyung-Yul; Kwon, Hyenyeon; Park, Seungkeun; Jeon, Sang-Woon
ArticleIssue Date2025CitationIEEE Access, v.13, pp 126700 - 126717PublisherInstitute of Electrical and Electronics Engineers Inc.