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Atomic-level Sharpening of a Carbon Nanotube Tip for High-resolution Scanning Tunneling Microscopy Go to Link

Kim, Jeehoon; Kim, Suenne; Huang, Junwei; de Lozanne, Alex

ArticleIssue Date2018CitationJOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.73, no.3, pp 396 - 398PublisherKOREAN PHYSICAL SOC

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Robust Ohmic contact junctions between metallic tips and multiwalled carbon nanotubes for scanned probe microscopy Go to Link

Kim, Suenne; Kim, Jeehoon; Berg, Morgann; de Lozanne, Alex

ArticleIssue Date2008CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.79, no.10, pp 1 - 5PublisherAMER INST PHYSICS

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Browsing by de Lozanne, AlexAuthor

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