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Scan based ageing level estimation for semiconductor devices
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박성주 | - |
| dc.date.accessioned | 2021-07-07T09:41:29Z | - |
| dc.date.available | 2021-07-07T09:41:29Z | - |
| dc.date.issued | 2017-10 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/105282 | - |
| dc.format.extent | 22 | - |
| dc.publisher | International Electrotechnical Commission (IEC) | - |
| dc.title | Scan based ageing level estimation for semiconductor devices | - |
| dc.type | Book | - |
| dc.contributor.affiliatedAuthor | 박성주 | - |
| dc.type.rims | BOOK | - |
| dc.description.isChapter | FALSE | - |
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