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Enabling test/diagnosis of automotive semiconductor chips through FlexRay network

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dc.contributor.authorAnsari, Muhammad Adil-
dc.contributor.authorAnsari, Abdul Rahim-
dc.contributor.authorKim, Jinuk-
dc.contributor.authorPark, Sungju-
dc.date.accessioned2021-06-22T14:43:24Z-
dc.date.available2021-06-22T14:43:24Z-
dc.date.issued2017-11-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/10599-
dc.description.abstractThe demand to ensure the safety, reliability and comfort in automobiles has increased the complexity of in-vehicle electronic systems. Like mechanical maintenance, regular monitoring of the health of semiconductor chips is also important. This paper presents a framework for a low abstraction level maintenance of semiconductor chips of the vehicular network nodes through FlexRay network, while complying with the FlexRay protocol. The proposed framework is demonstrated with the scan-test data transportation. ? 2017 IEEE.-
dc.format.extent5-
dc.language영어-
dc.language.isoENG-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleEnabling test/diagnosis of automotive semiconductor chips through FlexRay network-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/ICECTA.2017.8251924-
dc.identifier.scopusid2-s2.0-85045981176-
dc.identifier.wosid000430335800122-
dc.identifier.bibliographicCitation2017 International Conference on Electrical and Computing Technologies and Applications, ICECTA 2017, pp 1 - 5-
dc.citation.title2017 International Conference on Electrical and Computing Technologies and Applications, ICECTA 2017-
dc.citation.startPage1-
dc.citation.endPage5-
dc.type.docTypeConference Paper-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusControl system synthesis-
dc.subject.keywordPlusTest facilities-
dc.subject.keywordPlusAbstraction level-
dc.subject.keywordPlusAutomotive semiconductors-
dc.subject.keywordPlusFlexray networks-
dc.subject.keywordPlusMechanical maintenance-
dc.subject.keywordPlusSemiconductor chips-
dc.subject.keywordPlusVehicle Control-
dc.subject.keywordPlusVehicle electronics-
dc.subject.keywordPlusVehicular networks-
dc.subject.keywordPlusAutomobile electronic equipment-
dc.subject.keywordAuthorFlexRay network-
dc.subject.keywordAuthorscan-test technique for semiconductor chips-
dc.subject.keywordAuthorvehicle control networks-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8251924-
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