Enabling test/diagnosis of automotive semiconductor chips through FlexRay network
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ansari, Muhammad Adil | - |
dc.contributor.author | Ansari, Abdul Rahim | - |
dc.contributor.author | Kim, Jinuk | - |
dc.contributor.author | Park, Sungju | - |
dc.date.accessioned | 2021-06-22T14:43:24Z | - |
dc.date.available | 2021-06-22T14:43:24Z | - |
dc.date.created | 2021-05-11 | - |
dc.date.issued | 2017-11 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/10599 | - |
dc.description.abstract | The demand to ensure the safety, reliability and comfort in automobiles has increased the complexity of in-vehicle electronic systems. Like mechanical maintenance, regular monitoring of the health of semiconductor chips is also important. This paper presents a framework for a low abstraction level maintenance of semiconductor chips of the vehicular network nodes through FlexRay network, while complying with the FlexRay protocol. The proposed framework is demonstrated with the scan-test data transportation. ? 2017 IEEE. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.title | Enabling test/diagnosis of automotive semiconductor chips through FlexRay network | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Park, Sungju | - |
dc.identifier.doi | 10.1109/ICECTA.2017.8251924 | - |
dc.identifier.scopusid | 2-s2.0-85045981176 | - |
dc.identifier.wosid | 000430335800122 | - |
dc.identifier.bibliographicCitation | 2017 International Conference on Electrical and Computing Technologies and Applications, ICECTA 2017, pp.1 - 5 | - |
dc.relation.isPartOf | 2017 International Conference on Electrical and Computing Technologies and Applications, ICECTA 2017 | - |
dc.citation.title | 2017 International Conference on Electrical and Computing Technologies and Applications, ICECTA 2017 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 5 | - |
dc.type.rims | ART | - |
dc.type.docType | Conference Paper | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.subject.keywordPlus | Control system synthesis | - |
dc.subject.keywordPlus | Test facilities | - |
dc.subject.keywordPlus | Abstraction level | - |
dc.subject.keywordPlus | Automotive semiconductors | - |
dc.subject.keywordPlus | Flexray networks | - |
dc.subject.keywordPlus | Mechanical maintenance | - |
dc.subject.keywordPlus | Semiconductor chips | - |
dc.subject.keywordPlus | Vehicle Control | - |
dc.subject.keywordPlus | Vehicle electronics | - |
dc.subject.keywordPlus | Vehicular networks | - |
dc.subject.keywordPlus | Automobile electronic equipment | - |
dc.subject.keywordAuthor | FlexRay network | - |
dc.subject.keywordAuthor | scan-test technique for semiconductor chips | - |
dc.subject.keywordAuthor | vehicle control networks | - |
dc.identifier.url | https://ieeexplore.ieee.org/document/8251924 | - |
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