Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Vacuum Lamination of Polymer Gate Dielectric Layers for Facile Fabrication of Organic Transistors

Full metadata record
DC Field Value Language
dc.contributor.authorKim, Min-Jae-
dc.contributor.authorHong, Jin-Hwan-
dc.contributor.authorKim, Myeong-Hyeon-
dc.contributor.authorKim, Young-Shin-
dc.contributor.authorLee, Jaehoon-
dc.contributor.authorLee, Hwa Sung-
dc.contributor.authorKang, Boseok-
dc.date.accessioned2022-10-07T09:18:29Z-
dc.date.available2022-10-07T09:18:29Z-
dc.date.issued2022-06-
dc.identifier.issn2637-6113-
dc.identifier.issn2637-6113-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/110417-
dc.description.abstractA vacuum lamination method has been considered as a practical alternative to expensive and time-consuming layer deposition methods for fabricating the polymer dielectric layers of organic thin film transistors (OTFTs). Using this method, different layers of materials can be readily combined under a weak vacuum. However, poor adhesion at the interface between the organic semiconductor layer and laminated polymer dielectric layer limits the application of the vacuum lamination method only to the fabrication of organic single-crystal transistors; the fabricated transistors were not practical and operated only when a diaphragm pump was used to maintain the intimate adhesion between the single crystal and the polymer dielectric layer. In this work, we developed an advanced vacuum lamination strategy for fabricating a thin polymer dielectric layer on an arbitrary polymer semiconductor thin film. We observed that pasting glue at the rim of the sample and applying thermal annealing in a vacuum resulted in a strong intimate contact between the semiconductor and dielectric layer interface by efficiently removing air bubbles at the interface. The fabricated vacuum-laminated heterojunction structure was used in OTFTs and exhibited excellent electrical characteristics with a small number of trap sites. We believe that the proposed method would provide a facile research platform for studying polymer semiconductor/polymer dielectric layer heterojunctions.-
dc.format.extent8-
dc.language영어-
dc.language.isoENG-
dc.publisherAMER CHEMICAL SOC-
dc.titleVacuum Lamination of Polymer Gate Dielectric Layers for Facile Fabrication of Organic Transistors-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1021/acsaelm.2c00591-
dc.identifier.scopusid2-s2.0-85134526883-
dc.identifier.wosid000821856900001-
dc.identifier.bibliographicCitationACS Applied Electronic Materials, v.4, no.7, pp 3640 - 3647-
dc.citation.titleACS Applied Electronic Materials-
dc.citation.volume4-
dc.citation.number7-
dc.citation.startPage3640-
dc.citation.endPage3647-
dc.type.docTypeArticle; Early Access-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.subject.keywordPlusFIELD-EFFECT TRANSISTORS-
dc.subject.keywordPlusBIAS STABILITY-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusMOBILITY-
dc.subject.keywordPlusTRANSPORT-
dc.subject.keywordPlusBEHAVIOR-
dc.subject.keywordPlusSTRESS-
dc.subject.keywordPlusAL2O3-
dc.subject.keywordPlusOXIDE-
dc.subject.keywordAuthorvacuum lamination-
dc.subject.keywordAuthororganic semiconductor thin films-
dc.subject.keywordAuthorfield effect transistors-
dc.subject.keywordAuthorpolymer dielectric layer-
dc.subject.keywordAuthorOstwald ripening process-
dc.identifier.urlhttps://pubs.acs.org/doi/10.1021/acsaelm.2c00591-
Files in This Item
Go to Link
Appears in
Collections
COLLEGE OF ENGINEERING SCIENCES > DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Lee, Hwa sung photo

Lee, Hwa sung
ERICA 공학대학 (DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE