Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Interpretation of Channel Width-Dependent Shift in Device Characteristics of Oxide Semiconductor Thin-Film Transistors
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 오새룬터 | - |
| dc.date.accessioned | 2023-04-03T14:06:42Z | - |
| dc.date.available | 2023-04-03T14:06:42Z | - |
| dc.date.issued | 20220824 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/111925 | - |
| dc.title | Interpretation of Channel Width-Dependent Shift in Device Characteristics of Oxide Semiconductor Thin-Film Transistors | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | The 22nd International Meeting on Information Display | - |
| dc.citation.conferencePlace | BEXCO, Busan, Korea | - |
- Files in This Item
- There are no files associated with this item.
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.