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Impact of Seed Annealing on the Reliability of Monolithic GaAs/Si p-n Diode Optical Phase Shifters

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dc.contributor.authorTsiara, Artemisia-
dc.contributor.authorKim, Younghyun-
dc.contributor.authorYudistira, Didit-
dc.contributor.authorKunert, Bemardette-
dc.contributor.authorBaryshnikova, Marina-
dc.contributor.authorPantouvaki, Marianna-
dc.contributor.authorVan Campenhout, Joris-
dc.contributor.authorCroes, Kristof-
dc.date.accessioned2023-05-03T09:32:55Z-
dc.date.available2023-05-03T09:32:55Z-
dc.date.created2023-04-18-
dc.date.issued2022-09-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/112533-
dc.description.abstractWe report the reliability assessment of carrier-depletion p-n diode GaAs/Si optical modulators monolithically integrated on a 300-mm Si wafer. Dark current remains stable under long accelerating aging tests. Devices without seed annealing experience a shift of Vp. Lp with no stress temperature dependence. (C) 2022 The Author(s)-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-
dc.titleImpact of Seed Annealing on the Reliability of Monolithic GaAs/Si p-n Diode Optical Phase Shifters-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Younghyun-
dc.identifier.wosid000925380500039-
dc.identifier.bibliographicCitation2022 EUROPEAN CONFERENCE ON OPTICAL COMMUNICATION (ECOC)-
dc.relation.isPartOf2022 EUROPEAN CONFERENCE ON OPTICAL COMMUNICATION (ECOC)-
dc.citation.title2022 EUROPEAN CONFERENCE ON OPTICAL COMMUNICATION (ECOC)-
dc.type.rimsART-
dc.type.docTypeProceedings Paper-
dc.description.journalClass3-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassother-
dc.relation.journalResearchAreaOptics-
dc.relation.journalResearchAreaTelecommunications-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalWebOfScienceCategoryTelecommunications-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/9979220?arnumber=9979220&SID=EBSCO:edseee-
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