Subcontinuum scale analysis of diamond lattice films through spatial multi-level coarsening method
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Goh, Byeong hwa | - |
dc.contributor.author | Choi, Joonmyung | - |
dc.date.accessioned | 2023-07-05T05:32:44Z | - |
dc.date.available | 2023-07-05T05:32:44Z | - |
dc.date.issued | 2023-06 | - |
dc.identifier.issn | 0263-8231 | - |
dc.identifier.issn | 1879-3223 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/112933 | - |
dc.description.abstract | In this study, a multilevel scalable spatial-coarsening method for diamond structures was developed to selectively scale the space represented by the particles. The bonding relationship between the particles of the interlayer facing different spatial regions is explained by the combination of the potential energies that dominate each side. The proposed method reproduces the tensor properties of the diamond crystal material with high accuracy under thermodynamic equilibrium covering a wide temperature range. Additionally, shock wave characteristics are examined for Si thin-films in which only the surface area is left as the all-atom level and upscaling is performed in the thickness direction. The change in particle velocity and stress due to the potential energy transferred in the thickness direction is maintained even after penetrating the interlevel layer, successfully predicting the all-atom model and experimental results. © 2023 Elsevier Ltd | - |
dc.format.extent | 11 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | Elsevier BV | - |
dc.title | Subcontinuum scale analysis of diamond lattice films through spatial multi-level coarsening method | - |
dc.type | Article | - |
dc.publisher.location | 영국 | - |
dc.identifier.doi | 10.1016/j.tws.2023.110738 | - |
dc.identifier.scopusid | 2-s2.0-85151757606 | - |
dc.identifier.wosid | 001008865200001 | - |
dc.identifier.bibliographicCitation | Thin-Walled Structures, v.187, pp 1 - 11 | - |
dc.citation.title | Thin-Walled Structures | - |
dc.citation.volume | 187 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 11 | - |
dc.type.docType | Article | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Mechanics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Civil | - |
dc.relation.journalWebOfScienceCategory | Engineering, Mechanical | - |
dc.relation.journalWebOfScienceCategory | Mechanics | - |
dc.subject.keywordPlus | FORCE-FIELD | - |
dc.subject.keywordPlus | ORDER | - |
dc.subject.keywordPlus | SIMULATION | - |
dc.subject.keywordPlus | COMPASS | - |
dc.subject.keywordPlus | SILICON | - |
dc.subject.keywordPlus | ENERGY | - |
dc.subject.keywordPlus | CHARGE | - |
dc.subject.keywordAuthor | Digital twinning | - |
dc.subject.keywordAuthor | Hamiltonian particle dynamics | - |
dc.subject.keywordAuthor | Mechanical properties | - |
dc.subject.keywordAuthor | Monocrystalline silicon film | - |
dc.subject.keywordAuthor | Multilevel coarse-graining | - |
dc.identifier.url | https://linkinghub.elsevier.com/retrieve/pii/S0263823123002161 | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
55 Hanyangdeahak-ro, Sangnok-gu, Ansan, Gyeonggi-do, 15588, Korea+82-31-400-4269 sweetbrain@hanyang.ac.kr
COPYRIGHT © 2021 HANYANG UNIVERSITY. ALL RIGHTS RESERVED.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.