Enhancement of cleanliness and deposition rate by understanding the multiple roles of the showerhead electrode in a capacitively coupled plasma reactoropen access
- Authors
- 김호준
- Issue Date
- Aug-2021
- Publisher
- MDPI AG
- Keywords
- Capacitively coupled plasma; Computational fluid dynamics; Fluid simulation; Gas transport; Hydrogenated amorphous silicon; Plasma enhanced chemical vapor deposition; Showerhead electrode
- Citation
- Coatings, v.11, no.8, pp 1 - 18
- Pages
- 18
- Indexed
- SCIE
SCOPUS
- Journal Title
- Coatings
- Volume
- 11
- Number
- 8
- Start Page
- 1
- End Page
- 18
- URI
- https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/113758
- DOI
- 10.3390/coatings11080999
- ISSN
- 2079-6412
- Abstract
- Increasing the productivity of a showerhead-type capacitively coupled plasma (CCP) reactor requires an in-depth understanding of various physical phenomena related to the showerhead, which is not only responsible for gas distribution, but also acts as the electrode. Thus, we investigated how to enhance the cleanliness and deposition rate by studying the multiple roles of the showerhead electrode in a CCP reactor. We analyzed the gas transport in a three-dimensional complex geometry, and the SiH4/He discharges were simulated in a two-dimensional simplified geometry. The process volume was installed between the showerhead electrode (radio frequency powered) and the heater electrode (grounded). Our aim of research was to determine the extent to which the heated showerhead contributed to increasing the deposition rate and to reducing the size of the large particles generated during processing. The temperature of the showerhead was increased to experimentally measure the number of particles transported onto the heater to demonstrate the effects thereof on the decrease in contamination. The number of particles larger than 45 nm decreased by approximately 93% when the showerhead temperature increased from 373 to 553 K. © 2021 by the author. Licensee MDPI, Basel, Switzerland.
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