Test access mechanism for automotive chips through vehicular control networks
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Jinuk | - |
dc.contributor.author | Ansari, Muhammad Adil | - |
dc.contributor.author | Kim, Dooyoung | - |
dc.contributor.author | Jung, Jihun | - |
dc.contributor.author | Kim, Youngsung | - |
dc.contributor.author | Park, Sungju | - |
dc.date.accessioned | 2021-06-22T15:21:59Z | - |
dc.date.available | 2021-06-22T15:21:59Z | - |
dc.date.created | 2021-01-22 | - |
dc.date.issued | 2017-10 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/11557 | - |
dc.description.abstract | Modern automobiles house many ECUs (Electronic Control Units), which are connected through VCNs (Vehicle Control Networks). Typically, integrated circuits are tested for structural defects, which could occur during fabrication. In general, vehicular ECUs are tested for functional operation. However, due to vibrations, high temperature, etc., defects might be developed in ICs. This work presents a test access mechanism for in-vehicle ICs based on VCNs. The proposed test access mechanism complies with protocols of VCNs and allows the access to the on-chip circuitry. © 2016 IEEE. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.title | Test access mechanism for automotive chips through vehicular control networks | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Park, Sungju | - |
dc.identifier.doi | 10.1109/ICCE-Asia.2016.7804728 | - |
dc.identifier.scopusid | 2-s2.0-85011088258 | - |
dc.identifier.bibliographicCitation | 2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016, pp.1 - 2 | - |
dc.relation.isPartOf | 2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016 | - |
dc.citation.title | 2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 2 | - |
dc.type.rims | ART | - |
dc.type.docType | Conference Paper | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | Automobile manufacture | - |
dc.subject.keywordPlus | Control system synthesis | - |
dc.subject.keywordPlus | Defects | - |
dc.subject.keywordPlus | Diagnosis | - |
dc.subject.keywordPlus | Integrated circuits | - |
dc.subject.keywordPlus | ECUs | - |
dc.subject.keywordPlus | Electronic control units | - |
dc.subject.keywordPlus | Flexray | - |
dc.subject.keywordPlus | Functional operation | - |
dc.subject.keywordPlus | On-chip circuitry | - |
dc.subject.keywordPlus | Structural defect | - |
dc.subject.keywordPlus | Test access mechanism | - |
dc.subject.keywordPlus | Vehicular control | - |
dc.subject.keywordPlus | Control systems | - |
dc.subject.keywordAuthor | CAN | - |
dc.subject.keywordAuthor | Diagnosis | - |
dc.subject.keywordAuthor | ECUs | - |
dc.subject.keywordAuthor | Flexray | - |
dc.subject.keywordAuthor | Test access mechanism | - |
dc.identifier.url | https://ieeexplore.ieee.org/document/7804728 | - |
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