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Test access mechanism for automotive chips through vehicular control networks

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dc.contributor.authorKim, Jinuk-
dc.contributor.authorAnsari, Muhammad Adil-
dc.contributor.authorKim, Dooyoung-
dc.contributor.authorJung, Jihun-
dc.contributor.authorKim, Youngsung-
dc.contributor.authorPark, Sungju-
dc.date.accessioned2021-06-22T15:21:59Z-
dc.date.available2021-06-22T15:21:59Z-
dc.date.created2021-01-22-
dc.date.issued2017-10-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/11557-
dc.description.abstractModern automobiles house many ECUs (Electronic Control Units), which are connected through VCNs (Vehicle Control Networks). Typically, integrated circuits are tested for structural defects, which could occur during fabrication. In general, vehicular ECUs are tested for functional operation. However, due to vibrations, high temperature, etc., defects might be developed in ICs. This work presents a test access mechanism for in-vehicle ICs based on VCNs. The proposed test access mechanism complies with protocols of VCNs and allows the access to the on-chip circuitry. © 2016 IEEE.-
dc.language영어-
dc.language.isoen-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleTest access mechanism for automotive chips through vehicular control networks-
dc.typeArticle-
dc.contributor.affiliatedAuthorPark, Sungju-
dc.identifier.doi10.1109/ICCE-Asia.2016.7804728-
dc.identifier.scopusid2-s2.0-85011088258-
dc.identifier.bibliographicCitation2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016, pp.1 - 2-
dc.relation.isPartOf2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016-
dc.citation.title2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016-
dc.citation.startPage1-
dc.citation.endPage2-
dc.type.rimsART-
dc.type.docTypeConference Paper-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusAutomobile manufacture-
dc.subject.keywordPlusControl system synthesis-
dc.subject.keywordPlusDefects-
dc.subject.keywordPlusDiagnosis-
dc.subject.keywordPlusIntegrated circuits-
dc.subject.keywordPlusECUs-
dc.subject.keywordPlusElectronic control units-
dc.subject.keywordPlusFlexray-
dc.subject.keywordPlusFunctional operation-
dc.subject.keywordPlusOn-chip circuitry-
dc.subject.keywordPlusStructural defect-
dc.subject.keywordPlusTest access mechanism-
dc.subject.keywordPlusVehicular control-
dc.subject.keywordPlusControl systems-
dc.subject.keywordAuthorCAN-
dc.subject.keywordAuthorDiagnosis-
dc.subject.keywordAuthorECUs-
dc.subject.keywordAuthorFlexray-
dc.subject.keywordAuthorTest access mechanism-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/7804728-
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